Secondary Ion Mass Spectrometry: top-end analytical tool for the geosciences
Dr. M. Wiedenbeck – Deutsches GeoForschungsZentrum GFZ
Tuesday, September 29 and Wednesday, September 30, 2015
GFZ, Telegrafenberg, 14473 Potsdam
Building Haus H, Room VR3
Secondary Ion Mass Spectrometry is one of the most powerful analytical tools available for characterizing the compositions of solid materials. For Earth scientists it can rapidly determine key parameters at sampling scales reaching below the 200 picogram sampling size. Important fields for which SIMS technology has been applied to geological or environmental materials include: oxygen isotopic determinations on climate archives, U-Pb age determinations and the search for raw materials.
Since December 2013 the GeoForschungsZentrum Potsdam has operated the newest generation of large geometry SIMS instrument. This two-day course will provide participants with a basic foundation of SIMS technology, including a discussion of its strengths and limitations. A visit to the Potsdam facility will provide a clear impression of how large instrumentation is used to investigate processes at the micron-scale. This module is an ideal opportunity for anyone interested in high-tech instrumentation supporting a very broad spectrum of geoscience research.
Course Requirements
Participants should have a basic knowledge statistics and analytical chemistry. Experience in using analytical instrumentation (e.g., electron probe or electron microscope) is advantageous.
Day 1 - Morning SessionLecture: Fundamentals of mass spectrometry and basic SIMS theory
Day 1 - Afternoon Session
On-site visit to the Potsdam user facility and work with peripheral infrastructure
Day 2 - Morning Session
Lecture: Isotope Ratio Determination by SIMS
Day 2 - Afternoon Session
On-site visit to the Potsdam user facility and work with SIMS data